DIN IEC 60068-2-29-1989 电器技术.基本环境试验规程.第2部分:试验.第29节:试验Eb和导则:碰撞
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【英文标准名称】:Electricalengineering;basicenvironmentaltestingprocedures;tests;testEbandguidance;bump;identicalwithIEC68-2-29:1987
【原文标准名称】:电器技术.基本环境试验规程.第2部分:试验.第29节:试验Eb和导则:碰撞
【标准号】:DINIEC60068-2-29-1989
【标准状态】:作废
【国别】:德国
【发布日期】:1989-08
【实施或试行日期】:
【发布单位】:德国标准化学会(DIN)
【起草单位】:DKE
【标准类型】:()
【标准水平】:()
【中文主题词】:定义;恒值冲击;试验;环境试验;电气设备;动力试验;电气工程;振动试验;电驱动装置
【英文主题词】:testing;electricalengineering;vibrationtesting;electrically-operateddevices;environmentaltesting;permanentshocking;dynamictesting;definitions;electricalequipment
【摘要】:
【中国标准分类号】:L04;K04
【国际标准分类号】:1290
【页数】:10P;A4
【正文语种】:德语
【英文标准名称】:StandardTestMethodforPhotoelasticDeterminationofResidualStressinaTransparentGlassMatrixUsingaPolarizingMicroscopeandOpticalRetardationCompensationProcedures
【原文标准名称】:用偏光显微镜和光学延迟补偿方法在透明玻璃基质中测定光弹性残余应力的标准试验方法
【标准号】:ASTMC978-2004
【标准状态】:现行
【国别】:
【发布日期】:2004
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:C14.10
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:残余应力;光弹性;薄板玻璃;试验方法;光弹法
【英文主题词】:residual;glass;polarizing;microscope;enamel
【摘要】:Thequalityandperformanceofanarticleofglasswaremaybeaffectednotonlybythepresenceofresidualstressesduetoheattreatmentabovethestrainpointintheware,butalsobyadditionalresidualstressescausedbydifferencesinthermalexpansionbetweentheglasssubstrate,andeithercord,fired-onvitreousenamel,orACLdecoration.Theeffectsofthoseadditionalresidualcord,enamel,orACLstressesandtheresultingperformanceofsuchitemsmaybeevaluatedbyperformancetestprocedures.SuchevaluationsofenamelorACLstressesmayalsobeaccomplishedthroughthedeterminationofappropriatephysicalpropertiesofthedecorationandmatrixglass,orbyanalyticalmethods.Thistestmethodoffersadirectandconvenientmeansofdeterminingthemagnitudesandspatialdistributionsofresidualstresssystemsinglasssubstrates.Thetestmethodissimple,convenient,andquantitativelyaccurate.ThistestmethodisusefulinevaluatingthedegreeofcompatibilitybetweenthecoefficientofthermalexpansionofanenamelorACLappliedtoaglasssubstrate.1.1Thistestmethodcoversthedeterminationofresidualstressesinatransparentglassmatrixbymeansofapolarizingmicroscopeusingnullorretardationcompensationprocedures.1.2Suchresidualstressdeterminationsareofimportanceinevaluatingthenatureanddegreeofresidualstressespresentinglassmatrixesduetocord,orthedegreeoffit,orsuitabilityofaparticularcombinationofglassmatrixandenamel,orappliedcolorlabel(ACL).1.3TheretardationcompensationmethodofopticallydeterminingandevaluatingenamelorACLresidualstresssystemsoffersdistinctadvantagesovermethodsrequiringphysicalpropertymeasurementsorwareperformancetestsduetoitssimplicity,reproducibility,andprecision.1.4Limitations8212;Thistestmethodisbasedonthestress-opticalretardationcompensationprinciple,andisthereforeapplicableonlytotransparentglasssubstrates,andnottoopaqueglasssystems.1.5Duetothepossibilityofadditionalresidualstressesproducedbyionexchangebetweenglassesofdifferentcompositions,someuncertaintymaybeintroducedinthevalueofthestressopticalcoefficientinthepointofinterestduetoalackofaccurateknowledgeofchemicalcompositionintheareasofinterest.1.6Thistestmethodisquantitativelyapplicabletoandvalidonlyforthoseapplicationswheresuchsignificantionexchangeisnotafactor,andstressopticalcoefficientsareknownordeterminable.1.7Theextentoftheionexchangeprocess,andhencethemagnitudesoftheresidualstressesproducedduetoionexchangewilldependontheexchangeprocessparameters.Theresidualstressdeterminationsmadeonsystemsinwhichionexchangehasoccurredshouldbeinterpretedwiththosedependenciesinmind.1.8ThevaluesstatedinSIunitsaretoberegardedasthestandard.Thevaluesgiveninparenthesesareforinformationonly.1.9Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:Q30
【国际标准分类号】:81_040_10
【页数】:9P.;A4
【正文语种】:
【英文标准名称】:Specificationforharmonizedsystemofqualityassessmentforelectroniccomponents-Semiconductordevices-Integratedcircuits-Blankdetailspecification-Lineardigital-to-analogueconverters(DAC)
【原文标准名称】:电子元器件质量评估协调体系规范.半导体器件.集成电路.空白详细规.线性数字模拟转换器
【标准号】:BSQC790303-1994
【标准状态】:现行
【国别】:英国
【发布日期】:1994-02-15
【实施或试行日期】:1994-02-15
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:认可试验;数据转换器;作标记;电子设备及元件;资格鉴定;破坏试验;无损检验;详细规范;试验条件;电气试验;集成电路;线性集成电路;数字模拟转换器;检验
【英文主题词】:Convertors(metals);Detailspecification;Digital-analogueconvertors;Electronicengineering;Electronicequipmentandcomponents;Integratedcircuits;Interfacecircuits;Semiconductordevices
【摘要】:
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:22P.;A4
【正文语种】:英语